1. Product Overview
The LTE-2872U is a high-performance infrared (IR) emitter diode designed for reliable operation in sensing and detection applications. Its core function is to emit infrared light at a peak wavelength of 940 nanometers, which is invisible to the human eye but ideal for electronic detection systems. The primary application highlighted in the datasheet is for smoke detectors, for which the component holds UL approval, underscoring its reliability and safety for critical life-safety equipment. The device is offered in a low-cost, clear transparent plastic end-looking package, providing a narrow beam pattern that enhances directionality and sensing accuracy.
1.1 Core Advantages and Target Market
The key advantages of the LTE-2872U series stem from its specific design choices. It is mechanically and spectrally matched to companion phototransistors in the LTR-3208 series, ensuring optimal performance in emitter-detector pairs commonly used in slot-type sensors (e.g., for paper detection in printers, object sensing). This matching simplifies design and improves signal integrity. The narrow beam characteristic increases the intensity over a smaller area, improving signal-to-noise ratio in aligned systems. The use of a Gallium Aluminum Arsenide (GaAlAs) window layer on a Gallium Arsenide (GaAs) substrate is a standard technology for efficient IR emission. The primary target market is industrial and consumer electronics requiring robust, low-cost infrared sensing, with a certified niche in smoke detection systems.
2. In-Depth Technical Parameter Analysis
The datasheet provides absolute maximum ratings and detailed electrical/optical characteristics, which are critical for circuit design and reliability assessment.
2.1 Absolute Maximum Ratings
These ratings define the limits beyond which permanent damage may occur. The device can dissipate up to 250 mW of power. The continuous forward current is rated at 150 mA, while a much higher peak forward current of 3 A is allowed under pulsed conditions (300 pps, 10 µs pulse width), which is useful for driving high-intensity short bursts. The maximum reverse voltage is 5 V, indicating the diode's limited tolerance to reverse bias. The operating temperature range is from -40°C to +85°C, and storage can be from -55°C to +100°C, making it suitable for harsh environments. Lead soldering temperature is specified as 260°C for 5 seconds at a distance of 1.6mm from the package body, providing guidance for assembly processes.
2.2 Electrical & Optical Characteristics
Parameters are tested at a standard forward current (IF) of 20 mA and an ambient temperature (TA) of 25°C. The forward voltage (VF) typically ranges from 1.2V to 1.6V. The reverse current (IR) is a maximum of 100 µA at a reverse voltage (VR) of 5V. The peak emission wavelength (λPeak) is 940 nm, and the spectral bandwidth (Δλ), defined as the half-width, is 50 nm. The viewing angle (2θ1/2) is 16 degrees, confirming the narrow beam specification.
3. Binning System Explanation
The LTE-2872U employs a rigorous binning system for its radiant output, which is crucial for applications requiring consistent optical performance. Two key parameters are binned: Aperture Radiant Incidence (Ee, in mW/cm²) and Radiant Intensity (IE, in mW/sr).
3.1 Radiant Output Binning
The datasheet lists multiple bins (A, B, C, D1, D2, D3, D4) for both Ee and IE. The bins represent sorted ranges of optical power. For example, Bin A for Radiant Intensity has a typical range of 3.31 to 7.22 mW/sr, while Bin D4 starts from 17.17 mW/sr. This allows designers to select a component with the precise output level needed for their application, ensuring adequate signal strength without over-specifying. Higher bin numbers generally correspond to higher efficiency or output devices. Designers must consult the specific bin codes when ordering to guarantee the required performance.
4. Performance Curve Analysis
The datasheet includes several typical characteristic curves that illustrate device behavior under varying conditions.
4.1 Spectral Distribution
Figure 1 shows the spectral distribution, peaking sharply at 940 nm with the aforementioned 50 nm half-width. This curve is vital for ensuring compatibility with the spectral sensitivity of the paired detector (like the LTR-3208).
4.2 Forward Current vs. Forward Voltage
Figure 3 depicts the IV (Current-Voltage) characteristic. It shows the exponential relationship typical of a diode. The curve allows designers to determine the necessary drive voltage for a desired operating current, which is essential for designing the current-limiting circuitry.
4.3 Relative Radiant Intensity vs. Forward Current
Figure 5 shows that the optical output (radiant intensity) is nearly linear with forward current in the typical operating range. This linearity simplifies modulation and control of the light output.
4.4 Relative Radiant Intensity vs. Ambient Temperature
Figure 4 is critical for understanding thermal effects. It shows that the radiant intensity decreases as the ambient temperature increases. This derating must be accounted for in designs intended to operate over the full temperature range, especially near the upper limit (+85°C), to ensure sufficient signal margin.
4.5 Radiation Diagram
Figure 6 provides a polar radiation pattern, visually confirming the 16-degree viewing angle. The pattern shows the angular distribution of the emitted infrared light, which is important for optical alignment and understanding the effective sensing area.
5. Mechanical & Package Information
5.1 Package Dimensions
The device uses a standard 5mm radial leaded package (often referred to as T-1¾). Key dimensions include the body diameter, lead spacing, and overall length. The drawing specifies that lead spacing is measured where leads emerge from the package. A maximum protrusion of resin under the flange is noted as 1.5mm. All dimensions have a standard tolerance of ±0.25mm unless otherwise stated.
5.2 Polarity Identification
For a standard IR emitter in this package, the longer lead is typically the anode (positive), and the shorter lead is the cathode (negative). The flat side on the package rim may also indicate the cathode side. Designers must verify this during assembly to prevent reverse connection.
6. Soldering & Assembly Guidelines
The datasheet provides specific instructions for soldering to prevent thermal damage to the semiconductor junction and the plastic package.
6.1 Hand or Wave Soldering
The absolute maximum rating specifies that leads can be soldered at 260°C for a maximum of 5 seconds, with the condition that the soldering point is at least 1.6mm (.063\") away from the package body. This distance allows heat to dissipate along the lead before reaching the sensitive components inside the package. Using a heat sink clip on the lead between the solder joint and the body is a recommended practice.
6.2 Storage Conditions
While not explicitly detailed beyond the storage temperature range (-55°C to +100°C), it is standard practice to store moisture-sensitive devices in a dry environment or in sealed, moisture-barrier bags with desiccant to prevent \"popcorning\" during reflow soldering, though this component is primarily for through-hole assembly.
7. Application Recommendations
7.1 Typical Application Scenarios
- Smoke Detectors: The UL approval makes it a primary choice. It is used in photoelectric smoke detectors where smoke particles scatter the IR beam from the emitter to a photodetector.
- Object/Slot Sensing: Paired with a matched phototransistor (e.g., LTR-3208) across a gap to detect the presence or absence of an object (paper in a printer, coin in a vending machine).
- Proximity Sensing: Used in systems where reflected IR light is detected to gauge distance or presence.
- Industrial Automation: For counting, positioning, and break-beam safety curtains.
7.2 Design Considerations
- Current Limiting: Always use a series resistor to limit the forward current to the desired value (e.g., 20 mA for spec measurements). Calculate resistor value using R = (Vsupply - VF) / IF.
- Thermal Management: Account for the decrease in output with temperature (see Fig. 4). For high-temperature or high-current operation, ensure the power dissipation (IF * VF) does not exceed 250 mW and consider derating.
- Optical Alignment: The narrow 16-degree beam requires precise mechanical alignment with the detector for optimal signal strength.
- Electrical Noise: For pulsed operation, ensure fast drive circuitry and consider shielding to prevent electromagnetic interference from affecting sensitive detector circuits.
8. Technical Comparison & Differentiation
While a direct competitor comparison is not in the datasheet, key differentiators of the LTE-2872U can be inferred. Its primary advantage is the guaranteed matching to the LTR-3208 phototransistor series, reducing design uncertainty. The availability of multiple output bins allows for cost-performance optimization. The narrow viewing angle is a specific feature not found in all IR emitters; wider-angle emitters provide less intensity at a specific point but cover a larger area. The UL certification for smoke detectors is a significant qualification that not all IR LEDs possess, opening the door to a regulated market.
9. Frequently Asked Questions (Based on Technical Parameters)
Q1: What is the purpose of the different bins (A, B, C, D1, etc.)?
A1: The bins categorize the LEDs based on their measured radiant output (intensity). This allows you to select a component that meets the minimum output required for your application reliably. Using a higher bin ensures a stronger signal but may cost slightly more.
Q2: Can I drive this LED with a 5V supply directly?
A2: No. The typical forward voltage is 1.2-1.6V. Connecting it directly to 5V would cause excessive current, destroying the LED. You must always use a current-limiting resistor in series.
Q3: Why does the output drop at higher temperatures?
A3: This is a fundamental characteristic of semiconductor light sources. Increased temperature increases non-radiative recombination within the semiconductor material, reducing the efficiency of light generation (electroluminescence).
Q4: What does \"spectrally matched\" mean?
A4: It means the peak emission wavelength of the emitter (940nm) aligns closely with the peak spectral sensitivity wavelength of the specified phototransistor detector. This maximizes the amount of emitted light that the detector can \"see\" and convert into an electrical signal.
10. Practical Design Case Study
Scenario: Designing a Paper-Out Sensor for a Printer. A common application is to detect when paper is absent in a tray. An LTE-2872U IR emitter is placed on one side of the paper path, and an LTR-3208 phototransistor is placed directly opposite. When paper is present, it blocks the IR beam, and the phototransistor output is low (or high, depending on circuit configuration). When paper is absent, the beam reaches the detector, changing its output state. Design Steps: 1) Choose an appropriate bin (e.g., Bin C) for sufficient signal margin. 2) Design the driver circuit: Use a microcontroller GPIO pin. With a 3.3V supply and a target IF of 20 mA, calculate R = (3.3V - 1.4V) / 0.02A = 95Ω. Use a standard 100Ω resistor. 3) Design the detector circuit: Connect the phototransistor in a common-emitter configuration with a pull-up resistor to create a digital signal. 4) Mechanically design the holder to ensure precise alignment of the emitter and detector across the paper path, utilizing the narrow 16-degree beam for accurate edge detection.
11. Principle of Operation Introduction
The LTE-2872U is a light-emitting diode (LED) that operates in the infrared spectrum. Its core principle is electroluminescence in a semiconductor p-n junction. When a forward voltage is applied, electrons from the n-type region and holes from the p-type region are injected into the junction region. When these charge carriers recombine, they release energy. In this specific material system (GaAlAs/GaAs), the energy released corresponds to a photon with a wavelength of approximately 940 nm, which is in the near-infrared region. The narrow beam is achieved through the geometry of the semiconductor die and the lensing effect of the clear plastic dome package, which collimates the emitted light.
12. Technology Trends and Context
Infrared emitters like the LTE-2872U are based on mature III-V semiconductor technology. Trends in the field include the development of emitters at different wavelengths (e.g., 850nm for some surveillance cameras, 1050nm for eye-safe applications) and with higher output powers and efficiencies. There is also a move towards surface-mount device (SMD) packages for automated assembly, though through-hole packages like this 5mm type remain popular for prototyping, repair, and applications requiring higher power handling or simpler manual assembly. The principle of matched emitter-detector pairs remains fundamental to reliable optoelectronic sensing. The integration of the emitter, driver, and sometimes the detector into a single module is another trend, simplifying system design for end-users.
LED Specification Terminology
Complete explanation of LED technical terms
Photoelectric Performance
| Term | Unit/Representation | Simple Explanation | Why Important |
|---|---|---|---|
| Luminous Efficacy | lm/W (lumens per watt) | Light output per watt of electricity, higher means more energy efficient. | Directly determines energy efficiency grade and electricity cost. |
| Luminous Flux | lm (lumens) | Total light emitted by source, commonly called "brightness". | Determines if the light is bright enough. |
| Viewing Angle | ° (degrees), e.g., 120° | Angle where light intensity drops to half, determines beam width. | Affects illumination range and uniformity. |
| CCT (Color Temperature) | K (Kelvin), e.g., 2700K/6500K | Warmth/coolness of light, lower values yellowish/warm, higher whitish/cool. | Determines lighting atmosphere and suitable scenarios. |
| CRI / Ra | Unitless, 0–100 | Ability to render object colors accurately, Ra≥80 is good. | Affects color authenticity, used in high-demand places like malls, museums. |
| SDCM | MacAdam ellipse steps, e.g., "5-step" | Color consistency metric, smaller steps mean more consistent color. | Ensures uniform color across same batch of LEDs. |
| Dominant Wavelength | nm (nanometers), e.g., 620nm (red) | Wavelength corresponding to color of colored LEDs. | Determines hue of red, yellow, green monochrome LEDs. |
| Spectral Distribution | Wavelength vs intensity curve | Shows intensity distribution across wavelengths. | Affects color rendering and quality. |
Electrical Parameters
| Term | Symbol | Simple Explanation | Design Considerations |
|---|---|---|---|
| Forward Voltage | Vf | Minimum voltage to turn on LED, like "starting threshold". | Driver voltage must be ≥Vf, voltages add up for series LEDs. |
| Forward Current | If | Current value for normal LED operation. | Usually constant current drive, current determines brightness & lifespan. |
| Max Pulse Current | Ifp | Peak current tolerable for short periods, used for dimming or flashing. | Pulse width & duty cycle must be strictly controlled to avoid damage. |
| Reverse Voltage | Vr | Max reverse voltage LED can withstand, beyond may cause breakdown. | Circuit must prevent reverse connection or voltage spikes. |
| Thermal Resistance | Rth (°C/W) | Resistance to heat transfer from chip to solder, lower is better. | High thermal resistance requires stronger heat dissipation. |
| ESD Immunity | V (HBM), e.g., 1000V | Ability to withstand electrostatic discharge, higher means less vulnerable. | Anti-static measures needed in production, especially for sensitive LEDs. |
Thermal Management & Reliability
| Term | Key Metric | Simple Explanation | Impact |
|---|---|---|---|
| Junction Temperature | Tj (°C) | Actual operating temperature inside LED chip. | Every 10°C reduction may double lifespan; too high causes light decay, color shift. |
| Lumen Depreciation | L70 / L80 (hours) | Time for brightness to drop to 70% or 80% of initial. | Directly defines LED "service life". |
| Lumen Maintenance | % (e.g., 70%) | Percentage of brightness retained after time. | Indicates brightness retention over long-term use. |
| Color Shift | Δu′v′ or MacAdam ellipse | Degree of color change during use. | Affects color consistency in lighting scenes. |
| Thermal Aging | Material degradation | Deterioration due to long-term high temperature. | May cause brightness drop, color change, or open-circuit failure. |
Packaging & Materials
| Term | Common Types | Simple Explanation | Features & Applications |
|---|---|---|---|
| Package Type | EMC, PPA, Ceramic | Housing material protecting chip, providing optical/thermal interface. | EMC: good heat resistance, low cost; Ceramic: better heat dissipation, longer life. |
| Chip Structure | Front, Flip Chip | Chip electrode arrangement. | Flip chip: better heat dissipation, higher efficacy, for high-power. |
| Phosphor Coating | YAG, Silicate, Nitride | Covers blue chip, converts some to yellow/red, mixes to white. | Different phosphors affect efficacy, CCT, and CRI. |
| Lens/Optics | Flat, Microlens, TIR | Optical structure on surface controlling light distribution. | Determines viewing angle and light distribution curve. |
Quality Control & Binning
| Term | Binning Content | Simple Explanation | Purpose |
|---|---|---|---|
| Luminous Flux Bin | Code e.g., 2G, 2H | Grouped by brightness, each group has min/max lumen values. | Ensures uniform brightness in same batch. |
| Voltage Bin | Code e.g., 6W, 6X | Grouped by forward voltage range. | Facilitates driver matching, improves system efficiency. |
| Color Bin | 5-step MacAdam ellipse | Grouped by color coordinates, ensuring tight range. | Guarantees color consistency, avoids uneven color within fixture. |
| CCT Bin | 2700K, 3000K etc. | Grouped by CCT, each has corresponding coordinate range. | Meets different scene CCT requirements. |
Testing & Certification
| Term | Standard/Test | Simple Explanation | Significance |
|---|---|---|---|
| LM-80 | Lumen maintenance test | Long-term lighting at constant temperature, recording brightness decay. | Used to estimate LED life (with TM-21). |
| TM-21 | Life estimation standard | Estimates life under actual conditions based on LM-80 data. | Provides scientific life prediction. |
| IESNA | Illuminating Engineering Society | Covers optical, electrical, thermal test methods. | Industry-recognized test basis. |
| RoHS / REACH | Environmental certification | Ensures no harmful substances (lead, mercury). | Market access requirement internationally. |
| ENERGY STAR / DLC | Energy efficiency certification | Energy efficiency and performance certification for lighting. | Used in government procurement, subsidy programs, enhances competitiveness. |